Surface Science using Scanning Probe Microscopy
Our group focuses on the characterization of surfaces and interfaces of various materials including metals, semiconductors, oxides, organic thin films, and adsorbed molecules. Scanning probe microscopy at the single atomic and molecular scales provides key information for the understanding of catalytic reaction mechanisms and the development of next-generation devices.
- STM (scanning tunneling microscopy) and AFM (atomic force microscopy) of oxide surfaces and gas adsorption behavior
- Fabrication and characterization of self-assembled porous organic thin films
- High-resolution STM/AFM imaging, spectroscopy, and reactions of adsorbed organic molecules
- Characterization of technologically relevant nanomaterials using STM, AFM, and spectroscopic measurements
- Instrumentation for high-resolution imaging of samples prepared in ambient conditions