Surface and Interface Science
Our group focuses on the characterization of surfaces and interfaces of various materials including metals, semiconductors, oxides, organic thin films, and adsorbed molecules. Scanning probe microscopy at the single atomic and molecular scales provides key information for the understanding of catalytic reaction mechanisms and the development of next-generation devices.
We are using several types of experimental techniques to characterize materials. Our specialty is scanning probe microscopy (SPM). Current projects include:
- Characterization of self-assembled porous organic thin films: nanoscale structural and chemical analysis using atomic force microscopy (AFM)-based infrared spectroscopy in ambient condition
- Single molecular scale imaging, spectroscopy, manipulation, and reactions of photochromic molecules using scanning tunneling microscopy (STM) under ultra-high vacuum at low temperature
- Investigation of surface structures, electronic states, gas adsorption behaviors of oxides using STM under ultra-high vacuum
- Characterization and rigorous analyses of technologically relevant nanomaterials using STM, AFM, and spectroscopic measurements such as x-ray photoelectron spectroscopy (XPS) and infrared (IR) spectroscopy
- Tip-enhanced Raman spectroscopy of carbon materials in ambient condition
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